6.18-stable review patch. If anyone has any objections, please let me know.
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From: Pei Xiao xiaopei01@kylinos.cn
[ Upstream commit 4910da6b36b122db50a27fabf6ab7f8611b60bf8 ]
The for_each_child_of_node() macro automatically manages device node reference counts during normal iteration. However, when breaking out of the loop early with return, the current iteration's node is not automatically released, leading to a reference count leak.
Fix this by adding of_node_put(child) before returning from the loop when emc2305_set_single_tz() fails.
This issue could lead to memory leaks over multiple probe cycles.
Signed-off-by: Pei Xiao xiaopei01@kylinos.cn Link: https://lore.kernel.org/r/tencent_5CDC08544C901D5ECA270573D5AEE3117108@qq.co... Signed-off-by: Guenter Roeck linux@roeck-us.net Signed-off-by: Sasha Levin sashal@kernel.org --- drivers/hwmon/emc2305.c | 4 +++- 1 file changed, 3 insertions(+), 1 deletion(-)
diff --git a/drivers/hwmon/emc2305.c b/drivers/hwmon/emc2305.c index 60809289f816..84cb9b72cb6c 100644 --- a/drivers/hwmon/emc2305.c +++ b/drivers/hwmon/emc2305.c @@ -685,8 +685,10 @@ static int emc2305_probe(struct i2c_client *client) i = 0; for_each_child_of_node(dev->of_node, child) { ret = emc2305_set_single_tz(dev, child, i); - if (ret != 0) + if (ret != 0) { + of_node_put(child); return ret; + } i++; } } else {