Integration test for tpdm can help to generate the data for verification of the topology during TPDM software bring up.
Sample: echo 1 > /sys/bus/coresight/devices/tmc_etf0/enable_sink echo 1 > /sys/bus/coresight/devices/tpdm0/enable_source echo 1 > /sys/bus/coresight/devices/tpdm0/integration_test echo 2 > /sys/bus/coresight/devices/tpdm0/integration_test cat /dev/tmc_etf0 > /data/etf-tpdm0.bin
Signed-off-by: Tao Zhang quic_taozha@quicinc.com Signed-off-by: Mao Jinlong quic_jinlmao@quicinc.com --- drivers/hwtracing/coresight/coresight-tpdm.c | 54 ++++++++++++++++++++ drivers/hwtracing/coresight/coresight-tpdm.h | 14 +++++ 2 files changed, 68 insertions(+)
diff --git a/drivers/hwtracing/coresight/coresight-tpdm.c b/drivers/hwtracing/coresight/coresight-tpdm.c index 70df888ac565..57e38aa7d2bd 100644 --- a/drivers/hwtracing/coresight/coresight-tpdm.c +++ b/drivers/hwtracing/coresight/coresight-tpdm.c @@ -123,6 +123,59 @@ static void tpdm_init_default_data(struct tpdm_drvdata *drvdata) CS_LOCK(drvdata->base); }
+/* + * value 1: 64 bits test data + * value 2: 32 bits test data + */ +static ssize_t integration_test_store(struct device *dev, + struct device_attribute *attr, + const char *buf, + size_t size) +{ + int i, ret = 0; + unsigned long val; + struct tpdm_drvdata *drvdata = dev_get_drvdata(dev->parent); + + ret = kstrtoul(buf, 10, &val); + if (ret) + return ret; + + if (val != 1 && val != 2) + return -EINVAL; + + if (!drvdata->enable) + return -EINVAL; + + if (val == 1) + val = ATBCNTRL_VAL_64; + else + val = ATBCNTRL_VAL_32; + CS_UNLOCK(drvdata->base); + writel_relaxed(0x1, drvdata->base + TPDM_ITCNTRL); + + for (i = 1; i < INTEGRATION_TEST_CYCLE; i++) + writel_relaxed(val, drvdata->base + TPDM_ITATBCNTRL); + + writel_relaxed(0, drvdata->base + TPDM_ITCNTRL); + CS_LOCK(drvdata->base); + return size; +} +static DEVICE_ATTR_WO(integration_test); + +static struct attribute *tpdm_attrs[] = { + &dev_attr_integration_test.attr, + NULL, +}; + +static struct attribute_group tpdm_attr_grp = { + .attrs = tpdm_attrs, +}; + +static const struct attribute_group *tpdm_attr_grps[] = { + &tpdm_attr_grp, + NULL, +}; + static int tpdm_probe(struct amba_device *adev, const struct amba_id *id) { struct device *dev = &adev->dev; @@ -157,6 +210,7 @@ static int tpdm_probe(struct amba_device *adev, const struct amba_id *id) desc.ops = &tpdm_cs_ops; desc.pdata = adev->dev.platform_data; desc.dev = &adev->dev; + desc.groups = tpdm_attr_grps; drvdata->csdev = coresight_register(&desc); if (IS_ERR(drvdata->csdev)) return PTR_ERR(drvdata->csdev); diff --git a/drivers/hwtracing/coresight/coresight-tpdm.h b/drivers/hwtracing/coresight/coresight-tpdm.h index f95aaad9c653..4aa880794383 100644 --- a/drivers/hwtracing/coresight/coresight-tpdm.h +++ b/drivers/hwtracing/coresight/coresight-tpdm.h @@ -14,6 +14,20 @@ /* Enable bit for DSB subunit */ #define TPDM_DSB_CR_ENA BIT(0)
+/* TPDM integration test registers */ +#define TPDM_ITATBCNTRL (0xEF0) +#define TPDM_ITCNTRL (0xF00) + +/* Register value for integration test */ +#define ATBCNTRL_VAL_32 0xC00F1409 +#define ATBCNTRL_VAL_64 0xC01F1409 + +/* + * Number of cycles to write value when + * integration test. + */ +#define INTEGRATION_TEST_CYCLE 10 + /** * This enum is for PERIPHIDR0 register of TPDM. * The fields [6:0] of PERIPHIDR0 are used to determine what